Flexible for Large Samples & Integrated Systems

m-Laue Flexible Single Crystal Orientation System

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A side-by-side comparison of Pulstec’s m-Laue single crystal orientation system in a shield box and on a tripod.

How It Works

Pulstec’s inline single crystal orientation can be configured for on-site and lab use. Similar to our original s-Laue model, the m-Laue is intuitive. It only takes three simple steps to determine single crystal orientation:

Use its CCD camera to set your sample and adjust to the right working distance.
Use the m-Laue software to start the X-ray irradiation and detection process.
Calculate the crystal’s orientation by fitting the Laue spots.

Features & Benefits

Fast Measurements: The m-Laue can acquire Laue spots of single crystal materials within 60 seconds.
Vertical Irradiation: This system allows vertical irradiation for easier sample setup, orientation flexibility, and improved resolution of Laue spots. Just align the object’s position with the vertical X-ray.
Integrated Air Cooling: This single crystal orientation system features an air-cooled X-ray generator and high-sensitivity detector, eliminating the need for an external water chiller.
Application Flexibility: The m-Laue’s X-ray sensor can be configured for mapping, on-site analysis, and/or system integration.

Pulstec’s m-Laue positioned on a tabletop with a prepared crystal sample.

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Specifications

Measurement Method: Laue (Back Reflection)
X-ray Source: W (Tungsten)
Voltage: 45W/30kV (1.5mA)
Power: 100 AC, 240V, 50/60 Hz
Power Consumption: 150W Maximum
Incident Angle: 0 Degree
Irradiation Spot: φ0.8mm (Standard Collimator) or φ0.4mm

Sample Distance: 27mm
Sample Size: Flexible/varies based on the size of the shield box
Measurement Time: 60 Seconds
Sample Stage: Optional
Diameter (X-ray Sensor Only): 213mm (Width) x 114mm (Depth) x 107mm (Height)
Weight (X-ray Sensor Only): 2.4 kg
X-ray Leakage: 0 (0.01mRem or less) with shield box

Note: External stage (θ,χ,ψ, and z) is required; shielding plan is required

Applications

Measuring principal plane orientation.
Checking and adjusting cutting orientation.
Evaluating crystallinity.
Crystal orientation measurement on Ion implantation.
On-site crystal orientation measurement of large parts, including airplane and generator turbines.
Determining ingot cutoff orientation.
Measuring principal crystal orientation on wafers.

Optional Accessories

A diagram of Pulstec’s motorized XY slide stage

Motorized XY Stage

With the motorized XY slide stage, you can perform orientation mapping within a 150 x 150mm area.

Microscope

Achieve better, more precise alignment with Pulstec’s optional microscope.

Collimator

The X-ray spot size can be changed by replacing the collimator. We offer collimators with X-ray spot diameters of 0.8mm and 0.4mm.

A diagram of Pulstec’s goniometric stage

Gonio Stage

We offer various stage options (3-axis to 6-axis) for the m-Laue with multiple sizes to fit your needs.

Tripod

The m-Laue’s X-ray sensor can be mounted on the tripod for on-site measurements. The sample size is flexible when using the tripod.

Note: When using the tripod, you must create a safety area or use shielding.

Shield Box

Pulstec offers three shield box sizes:

Standard: 0.8m (Width) x 0.6m (Depth) x 0.6m (Height)
Middle: 1.4m (Width) x 0.9m (Depth) x 0.8m (Height)
Large: 2.0m (Width) x 1.2m (Depth) x 1.0m (Height)

All options have zero radiation leakage.

System Integration Bracket

If your systems need a sensor to measure crystal orientation, you can combine the m-Laue X-ray device with your machine using our specialized system integration bracket.

Get Started With Your Free Demo

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