Flexible for Large Samples & Integrated Systems

m-Laue Flexible Single Crystal Orientation System

A side-by-side comparison of Pulstec’s m-Laue single crystal orientation system in a shield box and on a tripod.

How It Works

Pulstec’s inline single crystal orientation can be configured for on-site and lab use. Similar to our original s-Laue model, the m-Laue is intuitive. It only takes three simple steps to determine single crystal orientation:

  1. Use its CCD camera to set your sample and adjust to the right working distance.
  2. Use the m-Laue software to start the X-ray irradiation and detection process.
  3. Calculate the crystal’s orientation by fitting the Laue spots.
green circles
A screenshot from the CCD camera in the Laue software, which shows the X-ray target on the single crystal sample.

Features & Benefits

  • Fast Measurements: The m-Laue can acquire Laue spots of single crystal materials within 60 seconds.
  • Vertical Irradiation: This system allows vertical irradiation for easier sample setup, orientation flexibility, and improved resolution of Laue spots. Just align the object’s position with the vertical X-ray.
  • Integrated Air Cooling: This single crystal orientation system features an air-cooled X-ray generator and high-sensitivity detector, eliminating the need for an external water chiller.
  • Application Flexibility: The m-Laue’s X-ray sensor can be configured for mapping, on-site analysis, and/or system integration.

Pulstec’s m-Laue positioned on a tabletop with a prepared crystal sample.
green circles

Request a sample measurement

Specifications

  • Measurement Method: Laue (Back Reflection)
  • X-ray Source: W (Tungsten)
  • Voltage: 45W/30kV (1.5mA)
  • Power: 100 AC, 240V, 50/60 Hz
  • Power Consumption: 150W Maximum
  • Incident Angle: 0 Degree
  • Irradiation Spot: φ0.8mm (Standard Collimator) or φ0.4mm

  • Sample Distance: 27mm
  • Sample Size: Flexible/varies based on the size of the shield box
  • Measurement Time: 60 Seconds
  • Sample Stage: Optional
  • Diameter (X-ray Sensor Only): 213mm (Width) x 114mm (Depth) x 107mm (Height)
  • Weight (X-ray Sensor Only): 2.4 kg
  • X-ray Leakage: 0 (0.01mRem or less) with shield box

Note: External stage (θ,χ,ψ, and z) is required; shielding plan is required

Applications

  • Measuring principle plane orientation.
  • Checking and adjusting cutting orientation.
  • Evaluating crystallinity.
  • Crystal orientation measurement on Ion implantation.
  • On-site crystal orientation measurement of large parts, including airplane and generator turbines.
  • Determining ingot cutoff orientation.
  • Measuring principle crystal orientation on wafers.

Laue spots displayed in the m-Laue software viewer
green circles

Optional Accessories

A diagram of Pulstec’s motorized XY slide stage

Motorized XY Stage

With the motorized XY slide stage, you can perform orientation mapping within a 150 x 150mm area.

Pulstec’s microscope, attached to the m-Laue X-ray sensor

Microscope

Achieve better, more precise alignment with Pulstec’s optional microscope.

an open case showing Pulstec’s collimator and two collimation tools

Collimator

The X-ray spot size can be changed by replacing the collimator. We offer collimators with X-ray spot diameters of 0.8mm and 0.4mm.

A diagram of Pulstec’s goniometric stage

Gonio Stage

We offer various stage options (3-axis to 6-axis) for the m-Laue with multiple sizes to fit your needs.

A tripod with the m-Laue mounted on it.

Tripod

The m-Laue’s X-ray sensor can be mounted on the tripod for on-site measurements. The sample size is flexible when using the tripod.

Note: When using the tripod, you must create a safety area or use shielding.

Pulstec’s shield box for on-site measurements

Shield Box

Pulstec offers three shield box sizes:

  • Standard: 0.8m (Width) x 0.6m (Depth) x 0.6m (Height)
  • Middle: 1.4m (Width) x 0.9m (Depth) x 0.8m (Height)
  • Large: 2.0m (Width) x 1.2m (Depth) x 1.0m (Height)

All options have zero radiation leakage.

Pulstec logo on green background

System Integration Bracket

If your systems need a sensor to measure crystal orientation, you can combine the m-Laue X-ray device with your machine using our specialized system integration bracket.

Speak with an Equipment Testing Expert

We know our technology is leading the industry. Allow us to show you the benefits of working with Pulstec. Contact us today for a free demonstration on-line or at your facility.