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  • Products
    • XRD Residual Stress Analyzer
    • Robotic Residual Stress Mapping System
    • s-Laue Single Crystal Orientation System
    • m-Laue Flexible Single Crystal Orientation System
    • Hardness EYE
    • Surface Hardness Variation Scanner
  • Services
  • Resources
    • Frequently Asked Questions
    • Resource Library
    • Free Sample Testing
  • About
    • About Pulstec
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  • Events
  • Contact
  • Request Info

Robot system integration with XRD & 3D Scanner (Residual stress mapping)

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Robot system integration with XRD & 3D Scanner (Residual stress mapping)

Electrochemical Polisher

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Electrochemical Polisher

μ-X360:Debye-Scherrer ring image due to differing crystal grain structures

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μ-X360:Debye-Scherrer ring image due to differing crystal grain structures

Debye-Scherrer ring extraction as displayed by the μ-X360 software

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Debye-Scherrer ring extraction as displayed by the μ-X360 software

Principles of X-ray diffraction and Debye-Scherrer ring

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Principles of X-ray diffraction and Debye-Scherrer ring
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Pulstec USA, Inc. is a subsidiary of Pulstec Industrial Co., Ltd of Japan. Pulstec USA, Inc. will provide sales, service and support to North and South American customers.

Products

  • XRD Residual Stress Analyzer
  • Single Crystal Orientation System
  • Surface Hardness Variation Scanner
  • Services
  • Resource Library

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  • Frequently Asked Questions
  • Industries
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  • Free Sample Testing
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