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X-Ray Single Crystal Orientation System

  |   By Momentum |  0 Comments

X-Ray Single Crystal Orientation System

μ-X360s brochure

  |   By Toshikazu Suzuki |  0 Comments

The micro-X360s XRD based residual stress analyzer can measure residual stress nondestructively by taking a complete diffraction ring by the two-dimensional detector.

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StressEasy software for robot control

  |   By Toshikazu Suzuki |  0 Comments

Portable X-ray Residual Stress Analyzer in use
Product_Information_StressEasy_sentenso_8-001190_PI_EN_02_2022-03-08Download

muraR Non-contact Surface Hardness Variation Scanner

  |   By Toshikazu Suzuki |  0 Comments

muraR Surface Hardness Variation Scanner
muraR_engDownload

μ-X360s Portable X-ray Residual Stress Analyzer

  |   By Toshikazu Suzuki |  0 Comments

Portable X-ray Residual Stress Analyzer
Flier – micro-X360s_rev4Download

Master Series – General Catalog

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Optical Disc Evaluation
master_enDownload

Electrochemical Polisher

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1598923236fKeyDownload

Retained Austenite Measurement

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1595323854DyBbDownload

X-ray Tube Exchange

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X-ray Tube Exchange
1638261803fdNSDownload

Collimator Exchange

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Collimator Exchange
1595323832XDSUDownload
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Pulstec USA, Inc. is a subsidiary of Pulstec Industrial Co., Ltd of Japan. Pulstec USA, Inc. will provide sales, service and support to North and South American customers.

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  • XRD Residual Stress Analyzer
  • Single Crystal Orientation System
  • Surface Hardness Variation Scanner
  • Optical Disc Evaluation
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  • Resource Library

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