Company Switches From a Conventional XRD to Pulstec’s μ-X360J

μ-X360J Portable X-ray Residual Stress Analyzer
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For many years, conventional XRD analyzers using the sin2𝜓 method were among the most common instruments for measuring residual stress and retained austenite in steel samples. A newer method, cosα, was discovered in the 1970s, but a 2D sensor wasn’t available at the time.

In 2010, Pulstec created the first commercial XRD analyzer, the μ-X360J, formerly known as μ-X360s. With this newer technology, manufacturers and research and development departments could capture the entire Debye-Scherrer ring in a single measurement.

Our goal when creating our XRD analyzer was to help manufacturers and R&D departments improve process efficiency by reducing preparation work and measurement time while still ensuring accuracy.

Why Pulstec’s Fast Measurements Made a Difference

One company contacted Pulstec because they were using a conventional sin2𝜓 XRD analyzer. While this method worked well for them for many years in measuring retained austenite, the volume of samples to be measured began to increase, and their old analyzer couldn’t handle that volume, slowing their process.

Depending on the sample they were measuring, their conventional XRD analyzer required mechanical tilting to collect the diffraction by means of a 0- or 1-dimension detector, and each new angle required recollecting the diffraction, also alignment is severe to keep the imagery centered.

Comparatively, Pulstec’s μ-X360J performs a single measurement by means of a two-dimensional detector without the need for mechanical tilting and recollecting. Instead of taking more than 20-30 minutes to collect the information needed to measure retained austenite, that time dropped to under 90 seconds per sample, increasing process speed dramatically, and allowing them to streamline their existing process to handle the change in sample volume.

Are You Dealing With a Similar Issue? Contact Pulstec Today

Do you need to speed up your process without sacrificing quality? Contact us today to learn more about our μ-X360J XRD analyzer—we offer free demos and sample measurements!

Toshi, the Vice President and U.S. salesperson of Pulstec

Toshikazu Suzuki's Bio

Toshi Suzuki is the Vice President of Pulstec USA, Inc., and has been working for the company for 27 years. During the first 13 years at Pulstec, Toshi worked as an engineer at the company's primary headquarters in Japan. In 2008, Toshi relocated to the United States to serve as Pulstec's lead U.S. salesperson. Toshi is passionate about helping manufacturers and engineers measure residual stress and educating the public on how residual stress can be measured by X-ray diffraction.