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Moved to new location

| | Events/NewsMoved to new location We are pleased to inform you that effective from April 1, 2026, Pulstec USA, Inc. has relocated to the following...Read More
Pulstec's X-360J measuring a tank

Best Applications for Pulstec’s μ-X360J XRD Analyzer

| | Blog, Residual Stress, X-Ray DiffractionPulstec’s μ-X360J XRD analyzer uses the cosα method to capture the full Debye-Scherrer ring, making it ideal for a wide range of applications.Read More
μ-X360J Portable X-ray Residual Stress Analyzer

Company Switches From a Conventional XRD to Pulstec’s μ-X360J

| | Case StudyPulstec’s μ-X360J XRD analyzer can measure retained austenite quickly—see how one company used our equipment to improve their process.Read More

Comparing the Different Methods of Residual Stress Mapping

| | Blog, Residual StressArea mapping offers a visual look at how residual stress is affecting a component. This article compares the four most common area mapping methods.Read More
A graph titled 'Reference sample by Yamamoto science tool.' On the left side of the chart are the numbers 0-80, representing a Rockwell Hardness rating. On the bottom of the chart are the numbers 0-12, which reference X-ray FWHM degrees. The chart showcases the correlation between surface hardness and FWHM: As FWHM increases, so does surface hardness.

Measuring Case Depth Hardness

| | Blog, Case Depth Hardness Testing, FWHMThis blog explores traditional and newer methods of measuring case depth hardness, ranging from Brinell and Rockwell to XRD.Read More
The m-Laue with a slide stage integration

Exploring the m-Laue Single Crystal Orientation System’s Integration Capabilities

| | Blog, Laue MethodPulstec’s m-Laue crystal orientation system is designed for in-line manufacturing quality control applications. Learn more about its integration capabilities.Read More